{"product_id":"9780071754279-semiconductor-process-reliabil","title":"Semiconductor Process Reliability in Practice","description":"\u003cmeta content=\"text\/html; charset=utf-8\" http-equiv=\"Content-Type\"\u003e\u003cp\u003e\u003cspan\u003eFilled with practical examples, this is a comprehensive reference on process reliability for semiconductor process and design engineers.\u003cbr\u003e\u003cb\u003ePublisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.\u003c\/b\u003e\u003cbr\u003eProven processes for ensuring semiconductor device reliability\u003cp\u003eCo-written by experts in the field, \u003ci\u003eSemiconductor Process Reliability in Practice\u003c\/i\u003e contains detailed descriptions and analyses of reliability and qualification for semiconductor device manufacturing and discusses the underlying physics and theory. The book covers initial specification definition, test structure design, analysis of test structure data, and final qualification of the process. Real-world examples of test structure designs to qualify front-end-of-line devices and back-end-of-line interconnects are provided in this practical, comprehensive guide.\u003c\/p\u003e\n\u003cp\u003e\u003cb\u003eCoverage includes:\u003c\/b\u003e\u003c\/p\u003e\n\u003cul\u003e\n\u003cli\u003eBasic device physics\u003c\/li\u003e\n\u003cli\u003eProcess flow for MOS manufacturing\u003c\/li\u003e\n\u003cli\u003eMeasurements useful for device reliability characterization\u003c\/li\u003e\n\u003cli\u003eHot carrier injection\u003c\/li\u003e\n\u003cli\u003eGate-oxide integrity (GOI) and time-dependentdielectric breakdown (TDDB)\u003c\/li\u003e\n\u003cli\u003eNegative bias temperature instability\u003c\/li\u003e\n\u003cli\u003ePlasma-induced damage\u003c\/li\u003e\n\u003cli\u003eElectrostatic discharge protection of integrated circuits\u003c\/li\u003e\n\u003cli\u003eElectromigration\u003c\/li\u003e\n\u003cli\u003eStress migration\u003c\/li\u003e\n\u003cli\u003eIntermetal dielectric breakdown\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003e\u003c\/p\u003e\n\u003cbr\u003e\u003cbr\u003e\u003c\/span\u003e\u003c\/p\u003e","brand":"Rarewaves","offers":[{"title":"Default Title","offer_id":40833614643297,"sku":"9780071754279","price":188.43,"currency_code":"GBP","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0092\/7504\/8033\/files\/orig_33035384.jpg?v=1738830609","url":"https:\/\/www.rarewaves.com\/products\/9780071754279-semiconductor-process-reliabil","provider":"Rarewaves.com","version":"1.0","type":"link"}